웨스트팩

  제품사진 제품명
리스트 게시판
Multiprobe
- FA Analysis
Corning Tropel

- Surface Flatness Measurement System

- Industrial Metrology

* Flat Master, MSP

- Semiconductor

* Flat Master, UltraSort, UltraFlat

- www.corning.com

Foothill Instruments
Film Thickness Measurement System

www.foothill-instruments.com
EUV Technology
EUV Mask Reflotmeter System
EUV Outgoing Gass Analyzer System

www.euvl.com
Molecular Imprints
Nanoimprint Lithography System

www.molecularimprints.com
Litho Tech Japan
Resist Analysis system
Lithography Process System

www.ltj.co.jp
RDA(ARM) Series
The Resist Development Analyzer is the most-advanced 18-channel development rate analysis evaluation equipment. Using this system, you can promptly carry out developing characteristic analysis such as measurement of photoresists development rates and calculation of contrast curves and sensitivity. You can also accurately determine resist model parameters required for the lithography simulator.
EXPOSURE SYSTEM
Exposure tool for research and development of photoresists
Exposure with G,H,I-line,KrF,ArF, EUV & E-BEAM
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