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Corning Tropel
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- Surface Flatness Measurement System
- Industrial Metrology
* Flat Master, MSP
- Semiconductor
* Flat Master, UltraSort, UltraFlat
- www.corning.com
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Wafer Flatness Measurement
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- Si, Sapphire, GaAs, SiC, GaN, LN, Quartz etc
- Sawing, Lapping, Polishing
- Process Development and IQC&OQC
- UltraSort150&200, FM200Wafer, FM-MSP300
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Mask(Reticle) Flatness Measurement
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- Quartz(Glass) non-contact flatness measurement system
- Blank, Pellicle mounted mask and EUV mask
- FM200Mask, UltraFlat
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Wafer Roughness Measurement
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FlatMaster Ra
-White light interferometer
-Roughness Measurement
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Wafer transition zone Measurement
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UltraSort Roll-off Measurement
- Advanced Optical Measurement of Wafer Transition Zone
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