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Wafer transition zone Measurement
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UltraSort Roll-off Measurement
- Advanced Optical Measurement of Wafer Transition Zone
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ENERGETIQ
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| 20 watt EUV source
Unique patented electrodeless Z-Pinch technology
- Low debris / low consumable cost
> 10 kHz pulse rate
- Enables high volume manufacturing (HVM) simulation
> Small plasma size
- Below 1mm diameter
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AZ Electronic Material
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| KLEBOSOL (Colloidal Silica)
High stability for dispersion
Sharp size distribution
Easy to handle
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Intego
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- ARGO : Wafer, cells and glass inspection
- AOUILA : SiC wafer inspection
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Vision Systems Sapphire
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- SIRIUS Brick/Ingot inspection
- SIRIUS Slab inspection
- SIRIUS Boule inspection(Kyropoulos)
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Vision System Semiconductor
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- Scope of delivery
- Condition for use
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FerroTec
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- High Temperature Processes
- LPCVD Processes
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SiFusion
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- Boats
- Pedestals
- injectors
- Ring Boats
- Liners
- shelf Boats
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